U-SHAPED DISTRIBUTIONS AT SEMICONDUCTOR INTERFACES AND THE NATURE OF THE RELATED DEFECT CENTERS

被引:17
作者
FLIETNER, H
机构
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1985年 / 91卷 / 01期
关键词
D O I
10.1002/pssa.2210910120
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:153 / 164
页数:12
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