U-SHAPED DISTRIBUTIONS AT SEMICONDUCTOR INTERFACES AND THE NATURE OF THE RELATED DEFECT CENTERS

被引：17

作者：

FLIETNER, H

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1985年 / 91卷 / 01期

关键词：

D O I：

10.1002/pssa.2210910120

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

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页码：153 / 164

页数：12

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