STATIC TECHNIQUE FOR PRECISE MEASUREMENTS OF SURFACE-POTENTIAL AND INTERFACE STATE DENSITY IN MOS STRUCTURES

被引：62

作者：

ZIEGLER, K ^{[1
]}

KLAUSMANN, E ^{[1
]}

机构：

[1] FRAUNHOFER GESELL, INST ANGEW FESTKOERPER PHYS, ECKER STR 4, 78 FREIBURG, FED REP GER

来源：

APPLIED PHYSICS LETTERS | 1975年 / 26卷 / 07期

关键词：

D O I：

10.1063/1.88193

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：400 / 402

页数：3

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