A-SI-H DEPOSITION FROM SIH4 AND SI2H6 RF-DISCHARGES - PRESSURE AND TEMPERATURE-DEPENDENCE OF FILM GROWTH IN RELATION TO THE ALPHA-GAMMA DISCHARGE TRANSITION

被引:95
作者
PERRIN, J [1 ]
CABARROCAS, PRI [1 ]
ALLAIN, B [1 ]
FRIEDT, JM [1 ]
机构
[1] CTR RECH CLAUDE DELORME,F-78350 JOUY EN JOSAS,FRANCE
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1988年 / 27卷 / 11期
关键词
D O I
10.1143/JJAP.27.2041
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:2041 / 2052
页数:12
相关论文
共 46 条
[1]   INSITU INVESTIGATION OF THE GROWTH OF RF GLOW-DISCHARGE DEPOSITED AMORPHOUS-GERMANIUM AND SILICON FILMS [J].
ANTOINE, AM ;
DREVILLON, B ;
CABARROCAS, PRI .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (07) :2501-2508
[2]   SUBSTRATE-TEMPERATURE DEPENDENCE OF SIH CONCENTRATION IN SILANE PLASMAS FOR AMORPHOUS-SILICON FILM DEPOSITION [J].
ASANO, Y ;
BAER, DS ;
HANSON, RK .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1987, 94 (01) :5-10
[3]   NUMERICAL-MODEL OF RF GLOW-DISCHARGES [J].
BOEUF, JP .
PHYSICAL REVIEW A, 1987, 36 (06) :2782-2792
[4]   DEPOSITION OF AMORPHOUS SILICON FILMS FROM GLOW-DISCHARGE PLASMAS OF SILANE [J].
BRODSKY, MH .
THIN SOLID FILMS, 1977, 40 (JAN) :L23-L25
[5]  
BROWN SC, 1966, BASIC DATA PLASMA PH
[6]  
CABARROCAS PRI, 1985, P ISPC 7, P136
[7]  
CHATHAM H, 1985, J APPL PHYS, V58, P164
[8]   NEUTRAL RADICAL DEPOSITION FROM SILANE DISCHARGES [J].
GALLAGHER, A .
JOURNAL OF APPLIED PHYSICS, 1988, 63 (07) :2406-2413
[9]   AMORPHOUS-SILICON DEPOSITION RATES IN DIODE AND TRIODE DISCHARGES [J].
GALLAGHER, A .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (04) :1369-1373
[10]   ELECTRON KINETICS OF SILANE DISCHARGES [J].
GARSCADDEN, A ;
DUKE, GL ;
BAILEY, WF .
APPLIED PHYSICS LETTERS, 1983, 43 (11) :1012-1014