SEU MEASUREMENTS USING CF-252 FISSION PARTICLES, ON CMOS STATIC RAMS, SUBJECTED TO A CONTINUOUS PERIOD OF LOW-DOSE RATE CO-60 IRRADIATION

被引：4

作者：

SANDERSON, TK ^{[1
]}

MAPPER, D ^{[1
]}

STEPHEN, JH ^{[1
]}

FARREN, J ^{[1
]}

ADAMS, L ^{[1
]}

HARBOESORENSEN, R ^{[1
]}

机构：

[1] EUROPEAN SPACE AGCY,ESTEC,2200 AG NOORDWIJK,NETHERLANDS

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1987年 / 34卷 / 06期

关键词：

D O I：

10.1109/TNS.1987.4337467

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1287 / 1291

页数：5

共 13 条

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[9] AN EXPERIMENTAL-STUDY OF THE EFFECT OF ABSORBERS ON THE LET OF THE FISSION PARTICLES EMITTED BY CF-252 [J].

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[10] THE USE OF CF-252 TO MEASURE LATCHUP CROSS-SECTIONS AS A FUNCTION OF LET [J].

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