共 20 条
[1]
IMPROVED HIGH-FREQUENCY MOS CAPACITANCE FORMULA
[J].
JOURNAL OF APPLIED PHYSICS,
1974, 45 (03)
:1276-1279
[2]
A NEW METHOD TO DETERMINE MOSFET CHANNEL LENGTH
[J].
ELECTRON DEVICE LETTERS,
1980, 1 (09)
:170-173
[3]
CHIU KY, 1982, IEEE T ELECTRON DEV, V29, P536, DOI 10.1109/T-ED.1982.20739
[4]
CHIU TY, 1984, J ELECTROCHEM SOC, V131, P2110, DOI 10.1149/1.2116029
[5]
IMPACT OF HIGH-TEMPERATURE PROCESSING ON BULK DEFECTS IN CZOCHRALSKI SILICON
[J].
PHYSICA B & C,
1983, 116 (1-3)
:148-161
[8]
GLASER AB, 1977, INTEGRATED CIRCUIT E, P301
[9]
SELECTIVE OXIDATION TECHNOLOGIES FOR HIGH-DENSITY MOS
[J].
ELECTRON DEVICE LETTERS,
1981, 2 (10)
:244-247
[10]
Hui J., 1982, International Electron Devices Meeting. Technical Digest, P220