POLYCRYSTALLINE SI UNDER STRAIN - ELASTIC AND LATTICE-DYNAMIC CONSIDERATIONS

被引:104
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ANASTASSAKIS, E
LIAROKAPIS, E
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10.1063/1.339296
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O59 [应用物理学];
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页码:3346 / 3352
页数:7
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  • [11] TIME-RESOLVED X-RAY-DIFFRACTION MEASUREMENT OF THE TEMPERATURE AND TEMPERATURE-GRADIENTS IN SILICON DURING PULSED LASER ANNEALING
    LARSON, BC
    WHITE, CW
    NOGGLE, TS
    BARHORST, JF
    MILLS, DM
    [J]. APPLIED PHYSICS LETTERS, 1983, 42 (03) : 282 - 284
  • [12] LIAROKAPIS E, UNPUB
  • [13] LONG DA, 1978, RAMAN SPECTROSCOPY
  • [14] SILICON STRAINED LAYERS GROWN ON GAP(001) BY MOLECULAR-BEAM EPITAXY
    MAREE, PMJ
    OLTHOF, RIJ
    FRENKEN, JWM
    VANDERVEEN, JF
    BULLELIEUWMA, CWT
    VIEGERS, MPA
    ZALM, PC
    [J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (08) : 3097 - 3103
  • [15] MORHANGE JF, 1979, LASER SOLIDS INTERAC, P429
  • [16] EFFECT OF PHOSPHORUS DOPING ON STRESS IN SILICON AND POLYCRYSTALLINE SILICON
    MURARKA, SP
    RETAJCZYK, TF
    [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (04) : 2069 - 2072
  • [17] RAMAN MICROPROBE STUDY OF RECRYSTALLIZATION IN ION-IMPLANTED AND LASER-ANNEALED POLYCRYSTALLINE SILICON
    NAKASHIMA, S
    INOUE, Y
    MIYAUCHI, M
    MITSUISHI, A
    NISHIMURA, T
    FUKUMOTO, T
    AKASAKA, Y
    [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (05) : 2611 - 2617
  • [18] RAMAN-SCATTERING STUDY OF ION-IMPLANTED AND CW-LASER ANNEALED POLYCRYSTALLINE SILICON
    NAKASHIMA, S
    OIMA, S
    MITSUISHI, A
    NISHIMURA, T
    FUKUMOTO, T
    AKASAKA, Y
    [J]. SOLID STATE COMMUNICATIONS, 1981, 40 (07) : 765 - 768
  • [19] RAMAN-SCATTERING FROM ZNTE-ZNSE STRAINED-LAYER SUPERLATTICES
    NAKASHIMA, S
    NAKAKURA, Y
    FUJIYASU, H
    MOCHIZUKI, K
    [J]. APPLIED PHYSICS LETTERS, 1986, 48 (03) : 236 - 238
  • [20] EVALUATION OF THE CRYSTALLINITY OF LASER-ANNEALED POLYCRYSTALLINE SILICON-ON-SILICON STRUCTURES BY RAMAN-MICROPROBE POLARIZATION MEASUREMENTS.
    Nakashima, S.
    Inoue, Y.
    Mitsuishi, A.
    [J]. Journal of Applied Physics, 1984, 56 (10) : 2989 - 2992