共 39 条
- [12] JELLISON GE, 1981, DEFECTS SEMICONDUCTO, V2, P241
- [13] DEEP LEVELS IN SCANNED ELECTRON-BEAM ANNEALED SILICON [J]. APPLIED PHYSICS LETTERS, 1980, 36 (06) : 425 - 428
- [14] KIMERLING LC, 1980, LASER ELECTRON BEAM, P385
- [15] KIREEV PS, 1975, PHYSICS SEMICONDUCTO
- [18] KRAKOW W, 1981, DEFECTS SEMICONDUCTO, V2, P185
- [19] LINDHARD J, 1965, MAT FYS MEDD DAN VID, V34, P14
- [20] FREQUENCY-DEPENDENT LOSS IN AMORPHOUS-SEMICONDUCTORS [J]. ADVANCES IN PHYSICS, 1982, 31 (05) : 553 - 637