PHOTOINJECTED HOT-ELECTRON DAMAGE IN SILICON POINT-CONTACT SOLAR-CELLS

被引：21

作者：

GRUENBAUM, PE

KING, RR

SWANSON, RM

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1989年 / 66卷 / 12期

关键词：

D O I：

10.1063/1.343592

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：6110 / 6114

页数：5

共 20 条

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[2]

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[7]

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[8]

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[9] TERRESTRIAL SOLAR SPECTRA, SOLAR SIMULATION AND SOLAR-CELL SHORT-CIRCUIT CURRENT CALIBRATION - A REVIEW [J].

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[10] ELECTRON-SPIN-RESONANCE STUDY OF INTERFACE STATES INDUCED BY ELECTRON INJECTION IN METAL-OXIDE-SEMICONDUCTOR DEVICES [J].

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