共 52 条
- [22] TOPOGRAPHICAL ANALYSIS IN THE SEM USING AN AUTOMATIC FOCUSING TECHNIQUE [J]. JOURNAL OF MICROSCOPY-OXFORD, 1982, 127 (JUL): : 93 - 103
- [23] HOROWITZ P, 1980, ART ELECTRONICS, P619
- [26] KIRKLAND EJ, 1987, DECUS VAX283 PROGR L
- [27] AUTOTUNING OF A TEM USING MINIMUM ELECTRON DOSE [J]. ULTRAMICROSCOPY, 1989, 27 (03) : 251 - 272
- [29] KOSTER AJ, 1988, SCANNING MICROSCOPY, P83
- [30] THE USE OF HISTOGRAMS FOR TRANSMISSION ELECTRON-MICROSCOPY - DEFOCUS AND ASTIGMATISM CORRECTION AT HIGH-RESOLUTION [J]. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1985, 2 (04): : 371 - 387