共 10 条
[2]
SINGLE EVENT ERROR IMMUNE CMOS RAM
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1982, 29 (06)
:2040-2043
[5]
ALPHA-PARTICLE-INDUCED FIELD AND ENHANCED COLLECTION OF CARRIERS
[J].
ELECTRON DEVICE LETTERS,
1982, 3 (02)
:31-34
[9]
PICKEL J, 1980, IEEE T NUCL SCI APR, P1006
[10]
SHAPIRO P, 1986, 5901 NAV RES LAB MEM