ANTICLASTIC CURVATURE MEASUREMENTS ON UNRIBBED CRYSTAL OPTICS FOR SYNCHROTRON-RADIATION

Various methods have been proposed for measuring the distortion in perfect crystals using double-crystal methods. The majority of these methods rely on making comparisons between double-crystal rocking curve measurements under the spatial extent of an extended x-ray beam. Unless the beam is large and parallel (such as at a synchrotron bending magnet), these methods are not easily scalable to large crystals (e.g., crystal focusing elements for synchrotron beamlines) due to the mechanical inaccuracies inherent in moving the various optical components. We present a method based on a scanning source which simplifies the problems in scaling double-crystal methods to large optics. In addition, results using this method are presented on a ribless sagittal focusing Si(111) crystal demonstrating that the anticlastic deviation can be made to be less than ±1 s of arc over a 1-cm-long section parallel to the sagittal axis. © 1995 American Institute of Physics.