TRAPS AT THE DEPOSITED INSULATOR INP INTERFACE - A DISCUSSION OF A POSSIBLE CAUSE

被引：13

作者：

WILMSEN, CW

WAGER, JF

GEIB, KM

HWANG, T

FATHIPOUR, M

机构：

来源：

THIN SOLID FILMS | 1983年 / 103卷 / 1-2期

关键词：

D O I：

10.1016/0040-6090(83)90423-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：47 / 52

页数：6

共 29 条

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