ADVANCES IN CHARACTERIZING AND CONTROLLING METAL-SEMICONDUCTOR INTERFACES

被引：3

作者：

BRILLSON, LJ

机构：

来源：

APPLICATIONS OF SURFACE SCIENCE | 1985年 / 22-3卷 / MAY期

关键词：

D O I：

10.1016/0378-5963(85)90228-4

中图分类号：

学科分类号：

摘要：

引用

页码：948 / 968

页数：21

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