SPECIFIC APPLICATIONS OF A 350 KV ION ACCELERATOR FOR PIXE ANALYSIS OF SOLID-STATE SAMPLES

被引：17

作者：

LINDNER, G

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1984年 / 3卷 / 1-3期

关键词：

D O I：

10.1016/0168-583X(84)90349-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：130 / 134

页数：5

共 39 条

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