INSITU ELLIPSOMETRY FOR REAL-TIME FEEDBACK-CONTROL OF OXIDATION FURNACES

被引:7
作者
SCHNEIDER, C [1 ]
BERGER, R [1 ]
PFITZNER, L [1 ]
RYSSEL, H [1 ]
机构
[1] UNIV ERLANGEN NURNBERG,LEHRSTUHL ELEKTRON BAUELEMENTE,W-8520 ERLANGEN,GERMANY
关键词
D O I
10.1016/0169-4332(93)90078-P
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A real-time control system is presented which has been developed in order to enhance accuracy and repeatability of layer processing in horizontal or vertical furnaces. The measurement system consists of an in situ ellipsometer and prism-based lightguiding optics for polarized light. Routines have been implemented for convenient alignment and real-time calculation of layer thickness taking into account the optical properties at high temperatures. Statistical data illustrate the improvement of reproducibility of thermal oxidation by end-point detection and end-point prediction. Feasibility of process integrity control and closed-loop control is demonstrated.
引用
收藏
页码:135 / 142
页数:8
相关论文
共 13 条
[1]   OPTIMIZING PRECISION OF ROTATING-ANALYZER ELLIPSOMETERS [J].
ASPNES, DE .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (05) :639-646
[2]   GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON [J].
DEAL, BE ;
GROVE, AS .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) :3770-&
[3]  
DOREMUS RH, 1988, 173RD P S M EL SOC, P17
[4]   THE INFLUENCE OF SILICON SURFACE CLEANING PROCEDURES ON SILICON OXIDATION [J].
GOULD, G ;
IRENE, EA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (04) :1031-1033
[5]   PARALLEL OXIDATION MECHANISM FOR SI OXIDATION IN DRY O2 [J].
HAN, CJ ;
HELMS, CR .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (05) :1297-1302
[7]   THERMAL-OXIDATION OF SILICON IN DRY OXYGEN GROWTH-RATE ENHANCEMENT IN THE THIN REGIME .1. EXPERIMENTAL RESULTS [J].
MASSOUD, HZ ;
PLUMMER, JD ;
IRENE, EA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (11) :2685-2693
[8]   A NEW MODEL FOR THE THERMAL-OXIDATION KINETICS OF SILICON [J].
NICOLLIAN, EH ;
REISMAN, A .
JOURNAL OF ELECTRONIC MATERIALS, 1988, 17 (04) :263-272
[9]  
Pedrotti F.L., 2017, INTRO OPTICS
[10]  
PFITZNER L, 1990, 5TH P S AUT INT CIRC, V90, P114