TELLURIUM-IMPLANTED N+ LAYERS IN GAAS

被引:17
作者
PASHLEY, RD
WELCH, BM
机构
[1] CALTECH,PASADENA,CA 91109
[2] ROCKWELL INT,SCI CTR,THOUSAND OAKS,CA 91360
关键词
D O I
10.1016/0038-1101(75)90115-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:977 / 981
页数:5
相关论文
共 19 条
[1]   ELECTRICAL AND STRUCTURE SENSITIVE MEASUREMENTS ON ION IMPLANTED GAAS [J].
BICKNELL, R ;
BELL, EC ;
HEMMENT, PLF ;
TANSEY, JE .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1972, 12 (01) :K9-&
[2]  
CHU WK, 1973, 3RD P INT ION IMPL C
[3]   ON PREPARATION OPTICAL PROPERTIES AND ELECTRICAL BEHAVIOUR OF ALUMINIUM NITRIDE [J].
COX, GA ;
CUMMINS, DO ;
KAWABE, K ;
TREDGOLD, RH .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1967, 28 (04) :543-&
[4]   PROPERTIES OF GALLIUM ARSENIDE DIODES BETWEEN 4.2 DEGREES AND 300 DEGREES K [J].
DUMIN, DJ ;
PEARSON, GL .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (11) :3418-&
[5]   SPECIFIC CONTACT RESISTANCE OF OHMIC CONTACTS TO GALLIUM-ARSENIDE [J].
EDWARDS, WD ;
TORRENS, AB ;
HARTMAN, WA .
SOLID-STATE ELECTRONICS, 1972, 15 (04) :387-&
[6]  
EISEN FH, 1973, 3 P INT ION IMPL C
[7]   EFFICIENT DOPING OF GAAS BY SE+ ION IMPLANTATION [J].
FOYT, AG ;
DONNELLY, JP ;
LINDLEY, WT .
APPLIED PHYSICS LETTERS, 1969, 14 (12) :372-&
[8]  
Grove A S, 1967, PHYS TECHNOLOGY SEMI
[9]   ALLOYING BEHAVIOR OF AU AND AU-GE ON GAAS [J].
GYULAI, J ;
MAYER, JW ;
RODRIGUEZ, V ;
YU, AYC ;
GOPEN, HJ .
JOURNAL OF APPLIED PHYSICS, 1971, 42 (09) :3578-+
[10]   INFLUENCE OF IMPLANTATION TEMPERATURE AND SURFACE PROTECTION ON TELLURIUM IMPLANTATION IN GAAS [J].
HARRIS, JS ;
MAYER, JW ;
EISEN, FH ;
HASKELL, JD ;
WELCH, B ;
PASHLEY, RD .
APPLIED PHYSICS LETTERS, 1972, 21 (12) :601-&