X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF BAND OFFSETS IN A-SI0.2C0.8-H/P-(A-SI-H) AND A-SI0.2C0.8-H/N-(A-SI-H) HETEROJUNCTIONS

被引：5

作者：

HIRAI, M

KUSAKA, M

IWAMI, M

AKAO, F

YOSHIMOTO, M

MATSUNAMI, H

机构：

[1] OKAYAMA UNIV, FAC TECHNOL, DEPT ELECTR ENGN, OKAYAMA 700, JAPAN

[2] KYOTO UNIV, FAC TECHNOL, DEPT ELECTR ENGN, KYOTO 606, JAPAN

来源：

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1989年 / 60卷 / 01期

关键词：

D O I：

10.1080/13642818908228813

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：51 / 60

页数：10

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