共 14 条
[1]
BOULIN DM, UNPUB
[2]
Chu W. K., 1978, BACKSCATTERING SPECT
[3]
CONTAMINATION EFFECTS IN ION-BEAM MIXED COBALT SILICIDE GROWTH
[J].
VACUUM,
1984, 34 (10-1)
:1017-1019
[4]
Lindhard J., 1963, MAT FYS MEDD DAN VID, V33, P1, DOI DOI 10.1002/ADMA.200904153
[6]
REFRACTORY SILICIDES FOR INTEGRATED-CIRCUITS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1980, 17 (04)
:775-792
[7]
MURARKA SP, 1983, SILICIDES VLSI APPLI
[8]
NICOLET MA, 1983, VLSI ELECTRONIC MICR
[9]
REVIEW OF BINARY ALLOY FORMATION BY THIN-FILM INTERACTIONS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1979, 16 (05)
:1112-1119
[10]
PHILLIPS J, 1978, THIN FILM PHENOMENA