SCANNING INTERNAL PHOTOEMISSION-STUDIES OF SODIUM-CONTAMINATED METAL-OXIDE-SEMICONDUCTOR CAPACITORS

被引：7

作者：

BOUTHILLIER, TM ^{[1
]}

YOUNG, L ^{[1
]}

TSOI, HY ^{[1
]}

机构：

[1] UNIV BRITISH COLUMBIA,DEPT ELECT ENGN,VANCOUVER V6T 1W5,BC,CANADA

来源：

JOURNAL OF APPLIED PHYSICS | 1983年 / 54卷 / 02期

关键词：

D O I：

10.1063/1.332020

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：957 / 962

页数：6

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