CORRELATION OF INTERFACIAL STRUCTURE AND MICROSTRESS OF YTTRIUM-MODIFIED ION-PLATED TITANIUM NITRIDE FILM WITH ITS ADHESION PROPERTY

被引:12
作者
LIU, CQ
WU, WT
YU, ZM
JIN, ZJ
机构
[1] Corrosion Science Laboratory, Institute of Corrosion and Protection of Metals, Academia Sinica, Shenyang, 110015
关键词
D O I
10.1016/0040-6090(92)90108-N
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The adhesion performance of ion-plated TiN yttrium-modified Ti(Y)N films to a mild steel (A3 steel) substrate have been evaluated by means of constant-rate tensile tests and scratch tests. Interface studies were carried out using transmission electron microscopy, and the microstresses in the films were measured using X-ray line profile analysis. The results show that Ti(Y)N film exhibits an excellent adherence to the substrate, which may be a result of the modification of yttrium at the interface so as to form a very good metallurgical transition bond.
引用
收藏
页码:98 / 101
页数:4
相关论文
共 13 条
[1]   ION REFLECTION, PENETRATION, AND ENTRAPMENT IN SOLIDS [J].
CARTER, G .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1970, 7 (01) :31-+
[2]  
JIN Z, 1989, ACTA METALL SINICA B, V2, P279
[3]   ON THE ADHESION OF NITRIDE COATINGS ON HSS SUBSTRATES [J].
KOPACZ, U ;
JEHN, HA .
VACUUM, 1986, 36 (1-3) :81-84
[4]   ADHESION AND TOUGHNESS OF PROTECTIVE COATINGS [J].
LAUGIER, MT .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1987, 5 (01) :67-69
[5]   STATES OF RESIDUAL-STRESS BOTH IN FILMS AND IN THEIR SUBSTRATES [J].
PERRY, AJ ;
CHOLLET, L .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (06) :2801-2808
[6]  
PIERSSON HO, 1982, THIN SOLID FILMS, V95, P69
[7]   INTERNAL-STRESS AND ADHERENCE OF TITANIUM NITRIDE COATINGS [J].
RICKERBY, DS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (06) :2809-2814
[8]   X-RAY-DIFFRACTION STUDIES OF PHYSICALLY VAPOUR-DEPOSITED COATINGS [J].
RICKERBY, DS ;
JONES, AM ;
BELLAMY, BA .
SURFACE & COATINGS TECHNOLOGY, 1989, 37 (01) :111-137
[9]  
TEER DG, 1979, J ADHESION, V8, P289
[10]   A TRANSMISSION ELECTRON-MICROSCOPY STUDY ON TI-N FILMS DEPOSITED BY ION PLATING [J].
WEN, LS ;
JIANG, X ;
SI, CY .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (06) :2682-2685