AN IMPROVED STANDARD TOTAL DOSE TEST FOR CMOS SPACE ELECTRONICS

被引：65

作者：

FLEETWOOD, DM ^{[1
]}

WINOKUR, PS ^{[1
]}

RIEWE, LC ^{[1
]}

PEASE, RL ^{[1
]}

机构：

[1] MISSION RES CORP,ALBUQUERQUE,NM 87106

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1989年 / 36卷 / 06期

关键词：

D O I：

10.1109/23.45393

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1963 / 1970

页数：8

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FLEETWOOD DM, UNPUB

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