DISTINCTION BETWEEN MIDGAP LEVELS IN LEC N-GAAS DETERMINED BY DLTS AND OPTICAL-ABSORPTION AT 1.1-MU-M

被引:14
作者
ISHIDA, K
YAHATA, A
KIKUTA, T
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1985年 / 24卷 / 04期
关键词
D O I
10.1143/JJAP.24.L250
中图分类号
O59 [应用物理学];
学科分类号
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页码:L250 / L252
页数:3
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共 8 条
[1]   STUDY OF 2 DIFFERENT DEEP LEVELS IN UNDOPED LEC SI-GAAS BY PHOTO-LUMINESCENCE SPECTROSCOPY [J].
KIKUTA, T ;
TERASHIMA, K ;
ISHIDA, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1983, 22 (07) :L409-L411
[2]   IDENTIFICATION OF OXYGEN-RELATED MIDGAP LEVEL IN GAAS [J].
LAGOWSKI, J ;
LIN, DG ;
AOYAMA, T ;
GATOS, HC .
APPLIED PHYSICS LETTERS, 1984, 44 (03) :336-338
[3]   FSGO POINT-CHARGE MODELS - THEIR ACCURACY AND EXTENSION TO HIGHER GAUSSIANS [J].
MARTIN, D ;
HALL, GG .
THEORETICA CHIMICA ACTA, 1981, 59 (03) :281-290
[4]   OPTICAL ASSESSMENT OF THE MAIN ELECTRON TRAP IN BULK SEMI-INSULATING GAAS [J].
MARTIN, GM .
APPLIED PHYSICS LETTERS, 1981, 39 (09) :747-748
[5]   CHARACTERIZATION OF NONUNIFORMITY IN SEMI-INSULATING LEC GAAS BY PHOTO-LUMINESCENCE SPECTROSCOPY [J].
TAJIMA, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1982, 21 (04) :L227-L229
[6]   VARIATION OF THE MIDGAP ELECTRON TRAPS (EL2) IN LIQUID ENCAPSULATED CZOCHRALSKI GAAS [J].
TANIGUCHI, M ;
IKOMA, T .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (11) :6448-6451
[7]  
TANIGUCHI M, 1982, SEMIINSULATING 3 5 M, P283
[8]   DEEP PHOTO-LUMINESCENCE BAND RELATED TO OXYGEN IN GALLIUM-ARSENIDE [J].
YU, PW ;
WALTERS, DC .
APPLIED PHYSICS LETTERS, 1982, 41 (09) :863-865