INFRARED STUDIES OF DEFECT PRODUCTION IN N-TYPE SI - IRRADIATION-TEMPERATURE DEPENDENCE

被引:34
作者
WHAN, RE
VOOK, FL
机构
来源
PHYSICAL REVIEW | 1967年 / 153卷 / 03期
关键词
D O I
10.1103/PhysRev.153.814
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:814 / &
相关论文
共 33 条
[1]  
BARUCH P, 1965, 7 P INT C PHYS SE ED, V3, P97
[2]  
BARUCH P, 1965, 7 P INT C PHYS SE ED, V3, P11
[3]   NEW OXYGEN INFRARED BANDS IN ANNEALED IRRADIATED SILICON [J].
CORBETT, JW ;
MCDONALD, RS ;
WATKINS, GD .
PHYSICAL REVIEW, 1964, 135 (5A) :1381-+
[4]   CONFIGURATION + DIFFUSION OF ISOLATED OXYGEN IN SILICON + GERMANIUM [J].
CORBETT, JW ;
MCDONALD, RS ;
WATKINS, GD .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1964, 25 (08) :873-&
[5]   DEFECTS IN IRRADIATED SILICON .2. INFRARED ABSSORPTION OF SI-A CENTER [J].
CORBETT, JW ;
WATKINS, GD ;
CHRENKO, RM ;
MCDONALD, RS .
PHYSICAL REVIEW, 1961, 121 (04) :1015-&
[6]   ANNEALING OF INFRARED DEFECT ABSORPTION BANDS IN 40-MEV ELECTRON-IRRADIATED SILICON [J].
CORELLI, JC ;
OEHLER, G ;
BECKER, JF ;
EISENTRA.KJ .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (05) :1787-&
[7]   ANNEALING OF BOMBARDMENT DAMAGE IN A DIAMOND-TYPE LATTICE - THEORETICAL [J].
FLETCHER, RC ;
BROWN, WL .
PHYSICAL REVIEW, 1953, 92 (03) :585-590
[8]   INJECTION-STIMULATED VACANCY REORDERING IN P-TYPE SILICON AT 76DEGREESK [J].
GREGORY, BL .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) :3765-&
[9]  
GREGORY BL, 1966, B AM PHYS SOC, V11, P193
[10]   ELECTRON BOMBARDMENT OF SILICON [J].
HILL, DE .
PHYSICAL REVIEW, 1959, 114 (06) :1414-1420