SURFACE CHEMICAL-SHIFTS AND PHOTOELECTRON DIFFRACTION IN COSI2

[1] CORE-LEVEL BINDING-ENERGY SHIFTS DUE TO RECONSTRUCTION ON THE SI(111) 2X1 SURFACE [J]. PHYSICAL REVIEW LETTERS, 1980, 45 (17) : 1414 - 1418

[2] OXYGEN INTERACTION WITH COSI(100) AND COSI2(100) SURFACES [J]. SURFACE SCIENCE, 1982, 117 (1-3) : 621 - 628

[3] SPUTTERING OF COSI(100) AND COSI2(100) SINGLE-CRYSTAL SURFACES [J]. APPLICATIONS OF SURFACE SCIENCE, 1983, 16 (3-4): : 453 - 462

[4] CHAMBERS SA, 1986, PHYS REV, V34, P93

[5] STRUCTURE AND NUCLEATION MECHANISM OF NICKEL SILICIDE ON SI(111) DERIVED FROM SURFACE EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE [J]. PHYSICAL REVIEW LETTERS, 1983, 51 (26) : 2402 - 2405

[6] COMIN F, 1985, STANFORD SYNCHROTRON, P115

[7] STRUCTURAL AND ELECTRONIC-PROPERTIES OF COSI2 EPITAXIALLY GROWN ON SI(111) [J]. SURFACE SCIENCE, 1986, 168 (1-3) : 171 - 183

[8] MOLECULAR-BEAM EPITAXIAL-GROWTH OF SI ON COSI2 SUBSTRATES [J]. APPLIED PHYSICS LETTERS, 1985, 47 (11) : 1200 - 1202

[9] FISCHER AEM, 1986, HASYLAB DESY1985 ANN, P281

[10] STRUCTURE DETERMINATION OF THE COSI2-SI(111) INTERFACE BY X-RAY STANDING-WAVE ANALYSIS [J]. PHYSICAL REVIEW B, 1987, 36 (09): : 4769 - 4773

[1] CORE-LEVEL BINDING-ENERGY SHIFTS DUE TO RECONSTRUCTION ON THE SI(111) 2X1 SURFACE [J]. PHYSICAL REVIEW LETTERS, 1980, 45 (17) : 1414 - 1418

[2] OXYGEN INTERACTION WITH COSI(100) AND COSI2(100) SURFACES [J]. SURFACE SCIENCE, 1982, 117 (1-3) : 621 - 628

[3] SPUTTERING OF COSI(100) AND COSI2(100) SINGLE-CRYSTAL SURFACES [J]. APPLICATIONS OF SURFACE SCIENCE, 1983, 16 (3-4): : 453 - 462

[4] CHAMBERS SA, 1986, PHYS REV, V34, P93

[5] STRUCTURE AND NUCLEATION MECHANISM OF NICKEL SILICIDE ON SI(111) DERIVED FROM SURFACE EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE [J]. PHYSICAL REVIEW LETTERS, 1983, 51 (26) : 2402 - 2405

[6] COMIN F, 1985, STANFORD SYNCHROTRON, P115

[7] STRUCTURAL AND ELECTRONIC-PROPERTIES OF COSI2 EPITAXIALLY GROWN ON SI(111) [J]. SURFACE SCIENCE, 1986, 168 (1-3) : 171 - 183

[8] MOLECULAR-BEAM EPITAXIAL-GROWTH OF SI ON COSI2 SUBSTRATES [J]. APPLIED PHYSICS LETTERS, 1985, 47 (11) : 1200 - 1202

[9] FISCHER AEM, 1986, HASYLAB DESY1985 ANN, P281

[10] STRUCTURE DETERMINATION OF THE COSI2-SI(111) INTERFACE BY X-RAY STANDING-WAVE ANALYSIS [J]. PHYSICAL REVIEW B, 1987, 36 (09): : 4769 - 4773