ELLIPSOMETRIC EXAMINATION OF THE OXIDATION OF VACUUM-DEPOSITED BISMUTH-FILMS

被引:12
作者
ATKINSON, R [1 ]
CURRAN, E [1 ]
机构
[1] NATL ELECT ENGN RES INST,COUNCIL SCI & IND RES,PRETORIA 0001,SOUTH AFRICA
关键词
D O I
10.1016/0040-6090(85)90083-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:333 / 339
页数:7
相关论文
共 11 条
[1]   SURFACE AND STRUCTURAL DEFECTS OF THIN BISMUTH-FILMS [J].
ABDELMOULA, K ;
PARDO, B ;
PARISET, C ;
RENARD, D .
THIN SOLID FILMS, 1979, 62 (03) :273-289
[2]  
Atkinson R., 1973, Thin Solid Films, V17, P207, DOI 10.1016/0040-6090(73)90129-6
[3]   STRUCTURAL ANOMALIES DISTURBING MEASUREMENT OF QUANTUM SIZE EFFECT [J].
BARNA, A ;
BARNA, PB ;
FEDOROWICH, R ;
RADNOCZI, G ;
SUGAWARA, H .
THIN SOLID FILMS, 1976, 36 (01) :75-79
[4]   ELECTRON-DIFFRACTION AND ELECTRON-MICROSCOPE STUDY OF THE 1ST STAGES OF THE GROWTH OF BISMUTH LAYERS - INFLUENCE OF THE NATURE OF THE BACKING [J].
BERTY, J ;
BRIEU, M ;
BUTTO, C ;
LEGROSDEMAUDUIT, B .
THIN SOLID FILMS, 1981, 82 (04) :321-336
[5]  
CURRAN EC, 1982, THESIS QUEENS U BELF
[6]   ELLIPSOMETRIC EXAMINATION OF THE THERMAL-OXIDATION PROCESS FOR PLATED CHROMIUM FILMS [J].
IDCZAK, E ;
OLESZKIEWICZ, E .
THIN SOLID FILMS, 1981, 77 (04) :301-303
[7]   AUTOMATIC ELLIPSOMETRY WITHOUT A PHASE PLATE [J].
LISSBERGER, PH ;
SALTER, IW ;
FITZPATRICK, M ;
TAYLOR, PL .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (06) :635-641
[8]   OPTICAL-PROPERTIES AND STOICHIOMETRY OF EVAPORATED BISMUTH OXIDE THIN-FILMS [J].
MEDERNACH, JW ;
MARTIN, RC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01) :63-66
[9]   CROSS-SECTIONAL STRUCTURE OF BI FILMS AND ITS PHENOMENOLOGICAL ANALYSIS [J].
NAMBA, Y ;
MORI, T .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (03) :1159-1164
[10]   STRUCTURE OF THERMALLY OXIDIZED BISMUTH-FILMS [J].
SHARMA, SK ;
PANDEY, SL .
THIN SOLID FILMS, 1979, 62 (02) :209-214