ELECTROLYTE ELECTROREFLECTANCE STUDY OF THE EFFECTS OF ANODIZATION AND OF CHEMOMECHANICAL POLISH ON HG1-XCDXTE

被引：47

作者：

LASTRASMARTINEZ, A ^{[1
]}

LEE, U ^{[1
]}

ZEHNDER, J ^{[1
]}

RACCAH, PM ^{[1
]}

机构：

[1] UNIV ILLINOIS,DEPT PHYS,CHICAGO,IL 60680

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1982年 / 21卷 / 01期

关键词：

D O I：

10.1116/1.571702

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：157 / 160

页数：4

共 10 条

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[6] VARIATIONS IN THE CARRIER CONCENTRATION IN ELEMENTAL AND COMPOUND SEMICONDUCTORS UTILIZING ELECTROLYTE ELECTROREFLECTANCE - TOPOGRAPHICAL INVESTIGATION
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[J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (08) : 5375 - 5380
[7] RIGHER DR, 1982, J VAC SCI TECHNOL, V21
[8] SCHMIT JD, UNPUB
[9] UPS STUDY OF THE ELECTRONIC-STRUCTURE OF HG1-XCDX TE - BREAKDOWN OF THE VIRTUAL CRYSTAL APPROXIMATION
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LINDAU, I
SPICER, WE
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 21 (01): : 142 - 145
[10] ZOLSBACK U, 1980, SURF SCI, V87, P191

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