INSITU CHARACTERIZATION OF NUCLEATION, GROWTH, AND COMPOSITION OF ION-ASSISTED FILMS BY ELLIPSOMETRY, REFLECTANCE-TRANSMITTANCE MEASUREMENTS, AND ION-SCATTERING SPECTROSCOPY

被引:5
作者
MARTIN, PJ
NETTERFIELD, RP
SAINTY, WG
PACEY, CG
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1986年 / 4卷 / 03期
关键词
D O I
10.1116/1.573908
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:463 / 464
页数:2
相关论文
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[4]   CHARACTERIZATION OF GROWING THIN-FILMS BY INSITU ELLIPSOMETRY, SPECTRAL REFLECTANCE AND TRANSMITTANCE MEASUREMENTS, AND ION-SCATTERING SPECTROSCOPY [J].
NETTERFIELD, RP ;
MARTIN, PJ ;
SAINTY, WG ;
DUFFY, RM ;
PACEY, CG .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (11) :1995-2003