SIMULATING THE EXIT WAVE-FUNCTION FOR UNIFORMLY DISORDERED-SYSTEMS

We describe a simple formalism to simulate the exit wave function for uniformly disordered systems. The method employed is equivalent to introducing random phases in real space, and allows one to describe the specimen shape, to use physically reasonable potentials as well as an average local atomic correlation. Examples will be given which demonstrate the suitability of the formalism to the simulation of: HREM images of amorphous material, HREM images of alloys containing short-range order, microdiffraction patterns from homogeneously disordered materials, diffraction patterns from amorphous materials and HREM images of crystalline materials coated with damage layers.