SURFACTANTS IN SI(111) HOMOEPITAXY

被引:29
作者
HORNVONHOEGEN, M
FALTA, J
COPEL, M
TROMP, RM
机构
[1] IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, NY 10598
关键词
D O I
10.1063/1.114065
中图分类号
O59 [应用物理学];
学科分类号
摘要
Si epitaxy is strongly affected by the presence of an adsorbate (surfactant). We have examined both film quality and dopant incorporation in homoepitaxy for Sb, As, and Ga terminated Si(111). The efficency of site exchange between Si and adsorbate depends sensitively on binding energy and binding geometry of the adsorbate. For a weakly bound adsorbate (Ga or Sb), there is no inhibition of epitaxy, but a strongly bound adsorbate (As) kinetically inhibits growth. © 1995 American Institute of Physics.
引用
收藏
页码:487 / 489
页数:3
相关论文
共 19 条
[11]   EVAPORATIVE ANTIMONY DOPING OF SILICON DURING MOLECULAR-BEAM EPITAXIAL-GROWTH [J].
METZGER, RA ;
ALLEN, FG .
JOURNAL OF APPLIED PHYSICS, 1984, 55 (04) :931-940
[12]   SCANNING TUNNELING MICROSCOPY OF SURFACTANT-MEDIATED EPITAXY OF GE ON SI(111) - STRAIN RELIEF MECHANISMS AND GROWTH-KINETICS [J].
MEYER, G ;
VOIGTLANDER, B ;
AMER, NM .
SURFACE SCIENCE, 1992, 274 (02) :L541-L545
[13]   MBE-RELATED SURFACE SEGREGATION OF DOPANT ATOMS IN SILICON [J].
NAKAGAWA, K ;
MIYAO, M ;
SHIRAKI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1988, 27 (11) :L2013-L2014
[14]   ARSENIC AND GALLIUM ATOM LOCATION ON SILICON (111) [J].
PATEL, JR ;
ZEGENHAGEN, J ;
FREELAND, PE ;
HYBERTSEN, MS ;
GOLOVCHENKO, JA ;
CHEN, DM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (04) :894-900
[15]   A NEW UHV SYSTEM FOR CHANNELING BLOCKING ANALYSIS OF SOLID-SURFACES AND INTERFACES [J].
TROMP, RM ;
KERSTEN, HH ;
GRANNEMAN, E ;
SARIS, FW ;
KOUDIJS, R ;
KILSDONK, WJ .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 4 (01) :155-166
[16]   A NEW 2-DIMENSIONAL PARTICLE DETECTOR FOR A TOROIDAL ELECTROSTATIC ANALYZER [J].
TROMP, RM ;
COPEL, M ;
REUTER, MC ;
VONHOEGEN, MH ;
SPEIDELL, J ;
KOUDIJS, R .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (11) :2679-2683
[17]   ION BEAM CRYSTALLOGRAPHY OF SURFACES AND INTERFACES [J].
Van der Veen, J. F. .
SURFACE SCIENCE REPORTS, 1985, 5 (5-6) :199-287
[18]  
ZINKEALLMANG M, 1987, SURF SCI, V191, pL749, DOI 10.1016/S0039-6028(87)81034-8
[19]   THE MORPHOLOGY OF ARSENIC TERMINATED SI(111) FROM DESORPTION-KINETICS [J].
ZINKEALLMANG, M ;
FELDMAN, LC ;
PATEL, JR ;
TULLY, JC .
SURFACE SCIENCE, 1988, 197 (1-2) :1-10