CHARACTERIZATION OF TRAP SITES IN THIN OXIDE ON SULFUR-PASSIVATED INP

被引：1

作者：

EFTEKHARI, G

机构：

[1] Department of Electrical Engineering, State University of New York, College at New Paltz

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1993年 / 138卷 / 01期

关键词：

D O I：

10.1002/pssa.2211380146

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：K59 / K61

页数：3

共 12 条

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