RADIATION-DAMAGE-INDUCED APPARENT OPTICAL-ABSORPTION INTERPRETED AS SCATTERING FROM DEFECT ZONES

被引：3

作者：

MEEK, RL

GIBSON, WM

MACLENNAN, CG

MAHER, DM

机构：

来源：

APPLIED PHYSICS LETTERS | 1972年 / 20卷 / 10期

关键词：

D O I：

10.1063/1.1653992

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：400 / +

页数：1

共 20 条

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[9] PREPARATION OF SUPPORTED, LARGE-AREA, UNIFORMLY THIN SILICON FILMS FOR PARTICLE-CHANNELING STUDIES [J].

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NUCLEAR INSTRUMENTS & METHODS, 1971, 94 (03) :435-+

[10] CHARGED-PARTICLE RADIATION DAMAGE OBSERVED AS DIMPLING OF THIN SILICON TARGETS [J].

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APPLIED PHYSICS LETTERS, 1971, 18 (12) :535-+

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