CAPTURE-EMISSION PROCESS IN DOUBLE POOLE-FRENKEL WELL TRAPS - THEORY AND EXPERIMENTS

被引：9

作者：

CHANG, CY

HSU, WC

WANG, SJ

HAU, SS

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1986年 / 60卷 / 03期

关键词：

D O I：

10.1063/1.337395

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1042 / 1045

页数：4

共 9 条

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[2]

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[3]

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[8] ELECTRIC-FIELD EFFECT ON THE THERMAL EMISSION OF TRAPS IN SEMICONDUCTOR JUNCTIONS [J].

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[9] ON THE PHYSICAL ORIGINS OF THE EL2 CENTER IN GAAS [J].

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