ANOMALOUS BEHAVIOR OF ION-IMPLANTED GASB

被引:73
作者
CALLEC, R
FAVENNEC, PN
SALVI, M
LHARIDON, H
GAUNEAU, M
机构
[1] Centre National d'Etudes des Télécommunications CNET, LAB/OCM, 22301 Lannion, Route de Trégastel
关键词
D O I
10.1063/1.106173
中图分类号
O59 [应用物理学];
学科分类号
摘要
Anomalous elevations up to 6-mu-m of the ion-implanted GaSb surface were observed. This swelling phenomenon is related to the formation of a porous layer and is dependent on the mass, energy, and dose of the implanted ions. A strong amount of oxygen was measured in the porous layers but this oxygen is likely not responsible for the swelling. The behavior of implanted GaSb is very similar to that of InSb previously described.
引用
收藏
页码:1872 / 1874
页数:3
相关论文
共 16 条
[1]  
APPLETON BR, 1984, MATER RES SOC S P, V27, P195
[2]  
DANILOV YA, 1980, SOV PHYS SEMICOND+, V14, P117
[3]   VERY EFFICIENT VOID FORMATION IN ION-IMPLANTED INSB [J].
DESTEFANIS, GL ;
GAILLIARD, JP .
APPLIED PHYSICS LETTERS, 1980, 36 (01) :40-42
[4]   MOLECULAR EFFECT IN THE EXPANSION OF ION-IMPLANTED INSB [J].
DESTEFANIS, GL ;
BELLE, JP ;
OGIERCOLLIN, JM ;
GAILLIARD, JP .
NUCLEAR INSTRUMENTS & METHODS, 1981, 182 (APR) :637-639
[5]  
GAILLIARD JP, 1979, UNPUB INT C HAMILTON
[6]   ANOMALOUS SPUTTERING OF GALLIUM ANTIMONIDE UNDER CESIUM-ION BOMBARDMENT [J].
HOMMA, Y .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1987, 5 (03) :321-326
[7]   RADIATION-INDUCED EXPANSION OF SEMICONDUCTORS [J].
KLEITMAN, D ;
YEARIAN, HJ .
PHYSICAL REVIEW, 1957, 108 (03) :901-901
[8]   OXIDATION OF AN INSB LAYER AFTER ION-IMPLANTATION [J].
MARTIN, P ;
LIGEON, E ;
GAILLIARD, JP .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 197 (01) :47-49
[9]   ION-IMPLANTATION DAMAGE AND ANNEALING IN INAS, GASB, AND GAP [J].
PEARTON, SJ ;
VONNEIDA, AR ;
BROWN, JM ;
SHORT, KT ;
OSTER, LJ ;
CHAKRABARTI, UK .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (02) :629-636
[10]   IMPLANTATION CHARACTERISTICS OF INSB [J].
PEARTON, SJ ;
NAKAHARA, S ;
VONNEIDA, AR ;
SHORT, KT ;
OSTER, LJ .
JOURNAL OF APPLIED PHYSICS, 1989, 66 (05) :1942-1946