MOVING GRATING TECHNIQUE - A NEW METHOD FOR THE DETERMINATION OF ELECTRON AND HOLE MOBILITIES AND THEIR LIFETIME

被引：28

作者：

HAKEN, U

HUNDHAUSEN, M

LEY, L

机构：

[1] Institut für Technische Physik, Friedrich-Alexander Universität Erlangen-Nürnberg Erwin-Rommel-Strasse 1

来源：

APPLIED PHYSICS LETTERS | 1993年 / 63卷 / 22期

关键词：

D O I：

10.1063/1.110260

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A new technique to determine the mobilities and lifetime of photogenerated electrons and holes in semiconductors relies on the short circuit current that is induced perpendicularly to a moving interference grating. Theoretical expressions for the short circuit current are derived that relate the carrier mobilities and their lifetime to the velocity and spatial period of the grating. The technique has been implemented and was successfully applied to a-Si:H.

引用

页码：3066 / 3068

页数：3

共 11 条

[1] A FLYING LIGHT SPOT METHOD FOR SIMULTANEOUS DETERMINATION OF LIFETIME AND MOBILITY OF INJECTED CURRENT CARRIERS [J].