ANISOTROPY DETECTION IN SAPPHIRE BY ACOUSTIC MICROSCOPE USING LINE-FOCUS BEAM

被引：32

作者：

KUSHIBIKI, J

OHKUBO, A

CHUBACHI, N

机构：

来源：

ELECTRONICS LETTERS | 1981年 / 17卷 / 15期

关键词：

D O I：

10.1049/el:19810374

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：534 / 536

页数：3

共 9 条

[1] PHYSICAL MODEL FOR ACOUSTIC SIGNATURES [J].

ATALAR, A .

JOURNAL OF APPLIED PHYSICS, 1979, 50 (12) :8237-8239

[2] PROPAGATION OF SURFACE WAVES AT BOUNDARY BETWEEN A PIEZOELECTRIC CRYSTAL AND A FLUID MEDIUM [J].

CAMPBELL, JJ ;

JONES, WR .

IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1970, SU17 (02) :71-+

[3]

KUSHIBIKI J, UNPUBLISHED

[4] RAY INTERPRETATION OF THE MATERIAL SIGNATURE IN THE ACOUSTIC MICROSCOPE [J].

PARMON, W ;

BERTONI, HL .

ELECTRONICS LETTERS, 1979, 15 (21) :684-686

[5]

SLOBODNIK AJ, 1973, MICROWAVE ACOUSTIC A, V1, P672

[6] ELASTIC CONSTANTS OF SYNTHETIC SINGLE CRYSTAL CORUNDUM AT ROOM TEMPERATURE [J].

WACHTMAN, JB ;

TEFFT, WE ;

LAM, DG ;

STINCHFIELD, RP .

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1960, 64 (03) :213-228

[7] MODEL FOR PREDICTING ACOUSTIC MATERIAL SIGNATURES [J].

WEGLEIN, RD .

APPLIED PHYSICS LETTERS, 1979, 34 (03) :179-181

[8] ACOUSTIC MICROSCOPY APPLIED TO SAW DISPERSION AND FILM THICKNESS MEASUREMENT [J].

WEGLEIN, RD .

IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1980, 27 (02) :82-86

[9] SAW DISPERSION AND FILM-THICKNESS MEASUREMENT BY ACOUSTIC MICROSCOPY [J].

WEGLEIN, RD .

APPLIED PHYSICS LETTERS, 1979, 35 (03) :215-217

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