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PROXIMATE CAPLESS ANNEALING OF GAAS USING A CONTROLLED-EXCESS AS VAPOR-PRESSURE SOURCE
被引:32
作者
:
WOODALL, JM
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,ITHACA,NY 14853
CORNELL UNIV,ITHACA,NY 14853
WOODALL, JM
[
1
]
RUPPRECHT, H
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,ITHACA,NY 14853
CORNELL UNIV,ITHACA,NY 14853
RUPPRECHT, H
[
1
]
CHICOTKA, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,ITHACA,NY 14853
CORNELL UNIV,ITHACA,NY 14853
CHICOTKA, RJ
[
1
]
WICKS, G
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,ITHACA,NY 14853
CORNELL UNIV,ITHACA,NY 14853
WICKS, G
[
1
]
机构
:
[1]
CORNELL UNIV,ITHACA,NY 14853
来源
:
APPLIED PHYSICS LETTERS
|
1981年
/ 38卷
/ 08期
关键词
:
D O I
:
10.1063/1.92462
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:639 / 641
页数:3
相关论文
共 19 条
[1]
CAPLESS ANNEALING OF ION-IMPLANTED GALLIUM-ARSENIDE BY A MELT-CONTROLLED AMBIENT TECHNIQUE
ANDERSON, CL
论文数:
0
引用数:
0
h-index:
0
ANDERSON, CL
VAIDYANATHAN, KV
论文数:
0
引用数:
0
h-index:
0
VAIDYANATHAN, KV
DUNLAP, HL
论文数:
0
引用数:
0
h-index:
0
DUNLAP, HL
KAMATH, GS
论文数:
0
引用数:
0
h-index:
0
KAMATH, GS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1980,
127
(04)
: 925
-
927
[2]
CHICOTKA RJ, 1980, 1980 IEEE 3 5 PROC T
[3]
SILICON-ION-IMPLANTED AND SELENIUM-ION-IMPLANTED GAAS REPRODUCIBLY ANNEALED AT TEMPERATURES UP TO 950DEGREESC
DONNELLY, JP
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
DONNELLY, JP
LINDLEY, WT
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
LINDLEY, WT
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
HURWITZ, CE
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(01)
: 41
-
43
[4]
LOW-DOSE N-TYPE ION-IMPLANTATION INTO CR-DOPED GAAS SUBSTRATES
DONNELLY, JP
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
DONNELLY, JP
BOZLER, CO
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
BOZLER, CO
LINDLEY, WT
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
LINDLEY, WT
[J].
SOLID-STATE ELECTRONICS,
1977,
20
(03)
: 273
-
276
[5]
EASTMAN LF, 1980, P AVS S HIGH SPEED H
[6]
OUTDIFFUSION THROUGH SILICON OXIDE AND SILICON NITRIDE LAYERS ON GALLIUM ARSENIDE
GYULAI, J
论文数:
0
引用数:
0
h-index:
0
GYULAI, J
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
MAYER, JW
MITCHELL, IV
论文数:
0
引用数:
0
h-index:
0
MITCHELL, IV
RODRIGUEZ, V
论文数:
0
引用数:
0
h-index:
0
RODRIGUEZ, V
[J].
APPLIED PHYSICS LETTERS,
1970,
17
(08)
: 332
-
+
[7]
HABER AM, 1979, APPL PHYS LETT, V34, P858
[8]
HOBGOOD HM, 1980, 1980 IEEE 3 5 PROC T
[9]
CAPLESS ANNEALING OF ION-IMPLANTED GAAS
IMMORLICA, AA
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,CTR SCI,THOUSAND OAKS,CA 91360
ROCKWELL INT,CTR SCI,THOUSAND OAKS,CA 91360
IMMORLICA, AA
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,CTR SCI,THOUSAND OAKS,CA 91360
ROCKWELL INT,CTR SCI,THOUSAND OAKS,CA 91360
EISEN, FH
[J].
APPLIED PHYSICS LETTERS,
1976,
29
(02)
: 94
-
95
[10]
CAPLESS ANNEAL OF ION-IMPLANTED GAAS IN CONTROLLED ARSENIC VAPOR
KASAHARA, J
论文数:
0
引用数:
0
h-index:
0
机构:
Sony Corporation Research Center, Hodogaya-ku, Yokohama, 174, Fujitsuka-cho
KASAHARA, J
ARAI, M
论文数:
0
引用数:
0
h-index:
0
机构:
Sony Corporation Research Center, Hodogaya-ku, Yokohama, 174, Fujitsuka-cho
ARAI, M
WATANABE, N
论文数:
0
引用数:
0
h-index:
0
机构:
Sony Corporation Research Center, Hodogaya-ku, Yokohama, 174, Fujitsuka-cho
WATANABE, N
[J].
JOURNAL OF APPLIED PHYSICS,
1979,
50
(01)
: 541
-
543
←
1
2
→
共 19 条
[1]
CAPLESS ANNEALING OF ION-IMPLANTED GALLIUM-ARSENIDE BY A MELT-CONTROLLED AMBIENT TECHNIQUE
ANDERSON, CL
论文数:
0
引用数:
0
h-index:
0
ANDERSON, CL
VAIDYANATHAN, KV
论文数:
0
引用数:
0
h-index:
0
VAIDYANATHAN, KV
DUNLAP, HL
论文数:
0
引用数:
0
h-index:
0
DUNLAP, HL
KAMATH, GS
论文数:
0
引用数:
0
h-index:
0
KAMATH, GS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1980,
127
(04)
: 925
-
927
[2]
CHICOTKA RJ, 1980, 1980 IEEE 3 5 PROC T
[3]
SILICON-ION-IMPLANTED AND SELENIUM-ION-IMPLANTED GAAS REPRODUCIBLY ANNEALED AT TEMPERATURES UP TO 950DEGREESC
DONNELLY, JP
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
DONNELLY, JP
LINDLEY, WT
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
LINDLEY, WT
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
HURWITZ, CE
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(01)
: 41
-
43
[4]
LOW-DOSE N-TYPE ION-IMPLANTATION INTO CR-DOPED GAAS SUBSTRATES
DONNELLY, JP
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
DONNELLY, JP
BOZLER, CO
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
BOZLER, CO
LINDLEY, WT
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
LINDLEY, WT
[J].
SOLID-STATE ELECTRONICS,
1977,
20
(03)
: 273
-
276
[5]
EASTMAN LF, 1980, P AVS S HIGH SPEED H
[6]
OUTDIFFUSION THROUGH SILICON OXIDE AND SILICON NITRIDE LAYERS ON GALLIUM ARSENIDE
GYULAI, J
论文数:
0
引用数:
0
h-index:
0
GYULAI, J
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
MAYER, JW
MITCHELL, IV
论文数:
0
引用数:
0
h-index:
0
MITCHELL, IV
RODRIGUEZ, V
论文数:
0
引用数:
0
h-index:
0
RODRIGUEZ, V
[J].
APPLIED PHYSICS LETTERS,
1970,
17
(08)
: 332
-
+
[7]
HABER AM, 1979, APPL PHYS LETT, V34, P858
[8]
HOBGOOD HM, 1980, 1980 IEEE 3 5 PROC T
[9]
CAPLESS ANNEALING OF ION-IMPLANTED GAAS
IMMORLICA, AA
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,CTR SCI,THOUSAND OAKS,CA 91360
ROCKWELL INT,CTR SCI,THOUSAND OAKS,CA 91360
IMMORLICA, AA
EISEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,CTR SCI,THOUSAND OAKS,CA 91360
ROCKWELL INT,CTR SCI,THOUSAND OAKS,CA 91360
EISEN, FH
[J].
APPLIED PHYSICS LETTERS,
1976,
29
(02)
: 94
-
95
[10]
CAPLESS ANNEAL OF ION-IMPLANTED GAAS IN CONTROLLED ARSENIC VAPOR
KASAHARA, J
论文数:
0
引用数:
0
h-index:
0
机构:
Sony Corporation Research Center, Hodogaya-ku, Yokohama, 174, Fujitsuka-cho
KASAHARA, J
ARAI, M
论文数:
0
引用数:
0
h-index:
0
机构:
Sony Corporation Research Center, Hodogaya-ku, Yokohama, 174, Fujitsuka-cho
ARAI, M
WATANABE, N
论文数:
0
引用数:
0
h-index:
0
机构:
Sony Corporation Research Center, Hodogaya-ku, Yokohama, 174, Fujitsuka-cho
WATANABE, N
[J].
JOURNAL OF APPLIED PHYSICS,
1979,
50
(01)
: 541
-
543
←
1
2
→