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USES OF PIXE AT LOW PROTON ENERGIES

被引：25
作者：
RICKARDS, J
OLIVER, A
MIRANDA, J
ZIRONI, EP
机构：
[1] Instituto de Física, Universidad Nacional Autónoma de México, México, 01000 D.F.
来源：
APPLIED SURFACE SCIENCE | 1990年 / 45卷 / 02期
关键词：
D O I：
10.1016/0169-4332(90)90066-9
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
A review of proton-induced PIXE at low energies (Ep ≤ 1 MeV) is presented. A discussion of applicable stopping powers, ionization cross sections and background processes is given, as well as their effects on quantitative analysis. The use of low-energy PIXE for thin-film thickness determination, one of its most useful applications, is also discussed. © 1990.
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页码：155 / 166
页数：12
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