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EFFECT OF ARSENIC SOURCE ON THE GROWTH OF HIGH-PURITY GAAS BY MOLECULAR-BEAM EPITAXY
被引:32
作者
:
CHAND, N
论文数:
0
引用数:
0
h-index:
0
CHAND, N
MILLER, RC
论文数:
0
引用数:
0
h-index:
0
MILLER, RC
SERGENT, AM
论文数:
0
引用数:
0
h-index:
0
SERGENT, AM
SPUTZ, SK
论文数:
0
引用数:
0
h-index:
0
SPUTZ, SK
LANG, DV
论文数:
0
引用数:
0
h-index:
0
LANG, DV
机构
:
来源
:
APPLIED PHYSICS LETTERS
|
1988年
/ 52卷
/ 20期
关键词
:
D O I
:
10.1063/1.99028
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:1721 / 1723
页数:3
相关论文
共 14 条
[1]
INCORPORATION AND CHARACTERIZATION OF ACCEPTORS IN EPITAXIAL GAAS
ASHEN, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
ROY RADAR ESTAB,MALVERN,WORCESTERSHIRE,ENGLAND
ASHEN, DJ
DEAN, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
ROY RADAR ESTAB,MALVERN,WORCESTERSHIRE,ENGLAND
DEAN, PJ
HURLE, DTJ
论文数:
0
引用数:
0
h-index:
0
机构:
ROY RADAR ESTAB,MALVERN,WORCESTERSHIRE,ENGLAND
HURLE, DTJ
MULLIN, JB
论文数:
0
引用数:
0
h-index:
0
机构:
ROY RADAR ESTAB,MALVERN,WORCESTERSHIRE,ENGLAND
MULLIN, JB
WHITE, AM
论文数:
0
引用数:
0
h-index:
0
机构:
ROY RADAR ESTAB,MALVERN,WORCESTERSHIRE,ENGLAND
WHITE, AM
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1975,
36
(10)
: 1041
-
1053
[2]
LOW-TEMPERATURE PHOTO-LUMINESCENCE OF LIGHTLY SI-DOPED AND UNDOPED MBE GAAS
BRIONES, F
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD CO,HEWLETT PACKARD LABS,SOLID STATE LAB,PALO ALTO,CA 94304
HEWLETT PACKARD CO,HEWLETT PACKARD LABS,SOLID STATE LAB,PALO ALTO,CA 94304
BRIONES, F
COLLINS, DM
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD CO,HEWLETT PACKARD LABS,SOLID STATE LAB,PALO ALTO,CA 94304
HEWLETT PACKARD CO,HEWLETT PACKARD LABS,SOLID STATE LAB,PALO ALTO,CA 94304
COLLINS, DM
[J].
JOURNAL OF ELECTRONIC MATERIALS,
1982,
11
(04)
: 847
-
866
[3]
SURFACE AND INTERFACE DEPLETION CORRECTIONS TO FREE CARRIER-DENSITY DETERMINATIONS BY HALL MEASUREMENTS
CHANDRA, A
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
CHANDRA, A
WOOD, CEC
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
WOOD, CEC
WOODARD, DW
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
WOODARD, DW
EASTMAN, LF
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
EASTMAN, LF
[J].
SOLID-STATE ELECTRONICS,
1979,
22
(07)
: 645
-
650
[4]
CHARACTERIZATION OF HIGH-PURITY GAAS GROWN BY MOLECULAR-BEAM EPITAXY
DINGLE, R
论文数:
0
引用数:
0
h-index:
0
DINGLE, R
WEISBUCH, C
论文数:
0
引用数:
0
h-index:
0
WEISBUCH, C
STORMER, HL
论文数:
0
引用数:
0
h-index:
0
STORMER, HL
MORKOC, H
论文数:
0
引用数:
0
h-index:
0
MORKOC, H
CHO, AY
论文数:
0
引用数:
0
h-index:
0
CHO, AY
[J].
APPLIED PHYSICS LETTERS,
1982,
40
(06)
: 507
-
510
[5]
GAAS STRUCTURES WITH ELECTRON-MOBILITY OF 5X10(6)CM2/VS
ENGLISH, JH
论文数:
0
引用数:
0
h-index:
0
ENGLISH, JH
GOSSARD, AC
论文数:
0
引用数:
0
h-index:
0
GOSSARD, AC
STORMER, HL
论文数:
0
引用数:
0
h-index:
0
STORMER, HL
BALDWIN, KW
论文数:
0
引用数:
0
h-index:
0
BALDWIN, KW
[J].
APPLIED PHYSICS LETTERS,
1987,
50
(25)
: 1826
-
1828
[6]
GROWTH BY MOLECULAR-BEAM EPITAXY AND CHARACTERIZATION OF HIGH-PURITY GAAS AND ALGAAS
HEIBLUM, M
论文数:
0
引用数:
0
h-index:
0
HEIBLUM, M
MENDEZ, EE
论文数:
0
引用数:
0
h-index:
0
MENDEZ, EE
OSTERLING, L
论文数:
0
引用数:
0
h-index:
0
OSTERLING, L
[J].
JOURNAL OF APPLIED PHYSICS,
1983,
54
(12)
: 6982
-
6988
[7]
KUNZEL H, 1980, APPL PHYS LETT, V37, P416, DOI 10.1063/1.91927
[8]
STUDY OF ELECTRON TRAPS IN N-GAAS GROWN BY MOLECULAR-BEAM EPITAXY
LANG, DV
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
LANG, DV
CHO, AY
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
CHO, AY
GOSSARD, AC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
GOSSARD, AC
ILEGEMS, M
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
ILEGEMS, M
WIEGMANN, W
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
WIEGMANN, W
[J].
JOURNAL OF APPLIED PHYSICS,
1976,
47
(06)
: 2558
-
2564
[9]
DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS
LANG, DV
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
LANG, DV
[J].
JOURNAL OF APPLIED PHYSICS,
1974,
45
(07)
: 3023
-
3032
[10]
GAAS WITH VERY LOW ACCEPTOR IMPURITY BACKGROUND GROWN BY MOLECULAR-BEAM EPITAXY
LARKINS, EC
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
LARKINS, EC
HELLMAN, ES
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
HELLMAN, ES
SCHLOM, DG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
SCHLOM, DG
HARRIS, JS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
HARRIS, JS
KIM, MH
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
KIM, MH
STILLMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
STILLMAN, GE
[J].
JOURNAL OF CRYSTAL GROWTH,
1987,
81
(1-4)
: 344
-
348
←
1
2
→
共 14 条
[1]
INCORPORATION AND CHARACTERIZATION OF ACCEPTORS IN EPITAXIAL GAAS
ASHEN, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
ROY RADAR ESTAB,MALVERN,WORCESTERSHIRE,ENGLAND
ASHEN, DJ
DEAN, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
ROY RADAR ESTAB,MALVERN,WORCESTERSHIRE,ENGLAND
DEAN, PJ
HURLE, DTJ
论文数:
0
引用数:
0
h-index:
0
机构:
ROY RADAR ESTAB,MALVERN,WORCESTERSHIRE,ENGLAND
HURLE, DTJ
MULLIN, JB
论文数:
0
引用数:
0
h-index:
0
机构:
ROY RADAR ESTAB,MALVERN,WORCESTERSHIRE,ENGLAND
MULLIN, JB
WHITE, AM
论文数:
0
引用数:
0
h-index:
0
机构:
ROY RADAR ESTAB,MALVERN,WORCESTERSHIRE,ENGLAND
WHITE, AM
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1975,
36
(10)
: 1041
-
1053
[2]
LOW-TEMPERATURE PHOTO-LUMINESCENCE OF LIGHTLY SI-DOPED AND UNDOPED MBE GAAS
BRIONES, F
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD CO,HEWLETT PACKARD LABS,SOLID STATE LAB,PALO ALTO,CA 94304
HEWLETT PACKARD CO,HEWLETT PACKARD LABS,SOLID STATE LAB,PALO ALTO,CA 94304
BRIONES, F
COLLINS, DM
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD CO,HEWLETT PACKARD LABS,SOLID STATE LAB,PALO ALTO,CA 94304
HEWLETT PACKARD CO,HEWLETT PACKARD LABS,SOLID STATE LAB,PALO ALTO,CA 94304
COLLINS, DM
[J].
JOURNAL OF ELECTRONIC MATERIALS,
1982,
11
(04)
: 847
-
866
[3]
SURFACE AND INTERFACE DEPLETION CORRECTIONS TO FREE CARRIER-DENSITY DETERMINATIONS BY HALL MEASUREMENTS
CHANDRA, A
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
CHANDRA, A
WOOD, CEC
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
WOOD, CEC
WOODARD, DW
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
WOODARD, DW
EASTMAN, LF
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
EASTMAN, LF
[J].
SOLID-STATE ELECTRONICS,
1979,
22
(07)
: 645
-
650
[4]
CHARACTERIZATION OF HIGH-PURITY GAAS GROWN BY MOLECULAR-BEAM EPITAXY
DINGLE, R
论文数:
0
引用数:
0
h-index:
0
DINGLE, R
WEISBUCH, C
论文数:
0
引用数:
0
h-index:
0
WEISBUCH, C
STORMER, HL
论文数:
0
引用数:
0
h-index:
0
STORMER, HL
MORKOC, H
论文数:
0
引用数:
0
h-index:
0
MORKOC, H
CHO, AY
论文数:
0
引用数:
0
h-index:
0
CHO, AY
[J].
APPLIED PHYSICS LETTERS,
1982,
40
(06)
: 507
-
510
[5]
GAAS STRUCTURES WITH ELECTRON-MOBILITY OF 5X10(6)CM2/VS
ENGLISH, JH
论文数:
0
引用数:
0
h-index:
0
ENGLISH, JH
GOSSARD, AC
论文数:
0
引用数:
0
h-index:
0
GOSSARD, AC
STORMER, HL
论文数:
0
引用数:
0
h-index:
0
STORMER, HL
BALDWIN, KW
论文数:
0
引用数:
0
h-index:
0
BALDWIN, KW
[J].
APPLIED PHYSICS LETTERS,
1987,
50
(25)
: 1826
-
1828
[6]
GROWTH BY MOLECULAR-BEAM EPITAXY AND CHARACTERIZATION OF HIGH-PURITY GAAS AND ALGAAS
HEIBLUM, M
论文数:
0
引用数:
0
h-index:
0
HEIBLUM, M
MENDEZ, EE
论文数:
0
引用数:
0
h-index:
0
MENDEZ, EE
OSTERLING, L
论文数:
0
引用数:
0
h-index:
0
OSTERLING, L
[J].
JOURNAL OF APPLIED PHYSICS,
1983,
54
(12)
: 6982
-
6988
[7]
KUNZEL H, 1980, APPL PHYS LETT, V37, P416, DOI 10.1063/1.91927
[8]
STUDY OF ELECTRON TRAPS IN N-GAAS GROWN BY MOLECULAR-BEAM EPITAXY
LANG, DV
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
LANG, DV
CHO, AY
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
CHO, AY
GOSSARD, AC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
GOSSARD, AC
ILEGEMS, M
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
ILEGEMS, M
WIEGMANN, W
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
WIEGMANN, W
[J].
JOURNAL OF APPLIED PHYSICS,
1976,
47
(06)
: 2558
-
2564
[9]
DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS
LANG, DV
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
LANG, DV
[J].
JOURNAL OF APPLIED PHYSICS,
1974,
45
(07)
: 3023
-
3032
[10]
GAAS WITH VERY LOW ACCEPTOR IMPURITY BACKGROUND GROWN BY MOLECULAR-BEAM EPITAXY
LARKINS, EC
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
LARKINS, EC
HELLMAN, ES
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
HELLMAN, ES
SCHLOM, DG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
SCHLOM, DG
HARRIS, JS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
HARRIS, JS
KIM, MH
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
KIM, MH
STILLMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
UNIV ILLINOIS,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
STILLMAN, GE
[J].
JOURNAL OF CRYSTAL GROWTH,
1987,
81
(1-4)
: 344
-
348
←
1
2
→