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THEORETICAL EXPRESSION FOR IMPEDANCE OF REVERSE-BIASED P-N JUNCTIONS WITH DEEP TRAPS
被引:14
作者
:
SCHULTZ, W
论文数:
0
引用数:
0
h-index:
0
SCHULTZ, W
机构
:
来源
:
SOLID-STATE ELECTRONICS
|
1971年
/ 14卷
/ 03期
关键词
:
D O I
:
10.1016/0038-1101(71)90036-0
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:227 / +
页数:1
相关论文
共 13 条
[1]
ON REVERSE-BIASED CAPACITANCE OF STEP P+-N JUNCTIONS WITH TRAPS
AUTH, J
论文数:
0
引用数:
0
h-index:
0
AUTH, J
[J].
PHYSICA STATUS SOLIDI,
1968,
27
(02):
: 653
-
+
[2]
COMPUTER SIMULATION OF A GOLD DOPED DIODE
CAUGHEY, DM
论文数:
0
引用数:
0
h-index:
0
CAUGHEY, DM
[J].
ELECTRONICS LETTERS,
1967,
3
(12)
: 548
-
+
[3]
GOLD AS A RECOMBINATION CENTRE IN SILICON
FAIRFIELD, JM
论文数:
0
引用数:
0
h-index:
0
FAIRFIELD, JM
GOKHALE, BV
论文数:
0
引用数:
0
h-index:
0
GOKHALE, BV
[J].
SOLID-STATE ELECTRONICS,
1965,
8
(08)
: 685
-
+
[4]
DEPLETION-LAYER CAPACITANCE OF P+N STEP JUNCTIONS
GUMMEL, HK
论文数:
0
引用数:
0
h-index:
0
GUMMEL, HK
SCHARFET.DL
论文数:
0
引用数:
0
h-index:
0
SCHARFET.DL
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(05)
: 2148
-
&
[5]
SPACE-CHARGE CAPACITANCE OF ASYMMETRIC ABRUPT P-N JUNCTIONS
KLEINKNECHT, HP
论文数:
0
引用数:
0
h-index:
0
KLEINKNECHT, HP
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(07)
: 3034
-
+
[6]
MARI AD, 1968, SOLID STATE ELECTRON, V11, P33
[7]
PEREL VI, 1968, SOV PHYS SEMICOND+, V1, P1403
[8]
THERMAL EMISSION RATES OF CARRIERS AT GOLD CENTERS IN SILICON
SAH, CT
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Materials Research Laboratory, University of Illinois, Urbana
SAH, CT
FORBES, L
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Materials Research Laboratory, University of Illinois, Urbana
FORBES, L
ROSIER, LI
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Materials Research Laboratory, University of Illinois, Urbana
ROSIER, LI
TASCH, AF
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Materials Research Laboratory, University of Illinois, Urbana
TASCH, AF
TOLE, AB
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Materials Research Laboratory, University of Illinois, Urbana
TOLE, AB
[J].
APPLIED PHYSICS LETTERS,
1969,
15
(05)
: 145
-
+
[9]
FREQUENCY DEPENDENCE OF REVERSE-BIASED CAPACITANCE OF GOLD-DOPED SILICON P+N STEP JUNCTIONS
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
REDDI, VGK
论文数:
0
引用数:
0
h-index:
0
REDDI, VGK
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1964,
ED11
(07)
: 345
-
+
[10]
SPATIAL VARIATION OF CHARGED GOLD CONCENTRATION IN SILICON P-N STEP JUNCTIONS
SCHRODER, DK
论文数:
0
引用数:
0
h-index:
0
SCHRODER, DK
TASCH, AF
论文数:
0
引用数:
0
h-index:
0
TASCH, AF
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1968,
ED15
(08)
: 553
-
+
←
1
2
→
共 13 条
[1]
ON REVERSE-BIASED CAPACITANCE OF STEP P+-N JUNCTIONS WITH TRAPS
AUTH, J
论文数:
0
引用数:
0
h-index:
0
AUTH, J
[J].
PHYSICA STATUS SOLIDI,
1968,
27
(02):
: 653
-
+
[2]
COMPUTER SIMULATION OF A GOLD DOPED DIODE
CAUGHEY, DM
论文数:
0
引用数:
0
h-index:
0
CAUGHEY, DM
[J].
ELECTRONICS LETTERS,
1967,
3
(12)
: 548
-
+
[3]
GOLD AS A RECOMBINATION CENTRE IN SILICON
FAIRFIELD, JM
论文数:
0
引用数:
0
h-index:
0
FAIRFIELD, JM
GOKHALE, BV
论文数:
0
引用数:
0
h-index:
0
GOKHALE, BV
[J].
SOLID-STATE ELECTRONICS,
1965,
8
(08)
: 685
-
+
[4]
DEPLETION-LAYER CAPACITANCE OF P+N STEP JUNCTIONS
GUMMEL, HK
论文数:
0
引用数:
0
h-index:
0
GUMMEL, HK
SCHARFET.DL
论文数:
0
引用数:
0
h-index:
0
SCHARFET.DL
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(05)
: 2148
-
&
[5]
SPACE-CHARGE CAPACITANCE OF ASYMMETRIC ABRUPT P-N JUNCTIONS
KLEINKNECHT, HP
论文数:
0
引用数:
0
h-index:
0
KLEINKNECHT, HP
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(07)
: 3034
-
+
[6]
MARI AD, 1968, SOLID STATE ELECTRON, V11, P33
[7]
PEREL VI, 1968, SOV PHYS SEMICOND+, V1, P1403
[8]
THERMAL EMISSION RATES OF CARRIERS AT GOLD CENTERS IN SILICON
SAH, CT
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Materials Research Laboratory, University of Illinois, Urbana
SAH, CT
FORBES, L
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Materials Research Laboratory, University of Illinois, Urbana
FORBES, L
ROSIER, LI
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Materials Research Laboratory, University of Illinois, Urbana
ROSIER, LI
TASCH, AF
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Materials Research Laboratory, University of Illinois, Urbana
TASCH, AF
TOLE, AB
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, Materials Research Laboratory, University of Illinois, Urbana
TOLE, AB
[J].
APPLIED PHYSICS LETTERS,
1969,
15
(05)
: 145
-
+
[9]
FREQUENCY DEPENDENCE OF REVERSE-BIASED CAPACITANCE OF GOLD-DOPED SILICON P+N STEP JUNCTIONS
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
REDDI, VGK
论文数:
0
引用数:
0
h-index:
0
REDDI, VGK
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1964,
ED11
(07)
: 345
-
+
[10]
SPATIAL VARIATION OF CHARGED GOLD CONCENTRATION IN SILICON P-N STEP JUNCTIONS
SCHRODER, DK
论文数:
0
引用数:
0
h-index:
0
SCHRODER, DK
TASCH, AF
论文数:
0
引用数:
0
h-index:
0
TASCH, AF
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1968,
ED15
(08)
: 553
-
+
←
1
2
→