共 10 条
[1]
RECOMBINATION AND TRAPPING IN NORMAL AND ELECTRON-IRRADIATED SILICON
[J].
PHYSICAL REVIEW,
1963, 129 (03)
:1174-&
[4]
CURTIS OL, 1965, RADIATION DAMAGE SEM, P143
[7]
TRAPPING OF MINORITY CARRIERS IN SILICON .1. P-TYPE SILICON
[J].
PHYSICAL REVIEW,
1955, 97 (02)
:311-321
[8]
STATISTICS OF THE RECOMBINATIONS OF HOLES AND ELECTRONS
[J].
PHYSICAL REVIEW,
1952, 87 (05)
:835-842
[10]
TRANSIENT RECOMBINATION OF EXCESS CARRIERS IN SEMICONDUCTORS
[J].
PHYSICAL REVIEW,
1958, 109 (04)
:1086-1091