MULTIPLICATION IN SEPARATE ABSORPTION, GRADING, CHARGE, AND MULTIPLICATION INP-INGAAS AVALANCHE PHOTODIODES

被引:32
作者
MA, CLF
DEEN, MJ
TAROF, LE
机构
[1] SIMON FRASER UNIV,SCH ENGN SCI,BURNABY,BC V5A 1S6,CANADA
[2] BELL NO RES LTD,OTTAWA,ON K1Y 4H7,CANADA
基金
加拿大自然科学与工程研究理事会;
关键词
D O I
10.1109/3.469291
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Planar separate absorption, grading, charge, and multiplication (SAGCM) InP-InGaAs avalanche photodiodes (APD's) are ideal for studying the multiplication (photogain) versus bias voltage (M-V) characteristics. In this paper, the M-V characteristics in SAGCM InP-InGaAs APD's are investigated both experimentally and theoretically. The self-calibrated nature of M and the bias-voltage independent quantum efficiency make it possible to compare theory and experiment accurately in an InP-based APD. The Miller empirical formula for Si and Ge is proved appropriate for the SAGCM InP-InGaAs APD's. Using a physics-based model, the M-V characteristics and its temperature dependence for all the SAGCM APD's with different device parameters is calculated theoretically, and the calculations are in good agreement to the experimental results.
引用
收藏
页码:2078 / 2089
页数:12
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