VOLTAGE-DEPENDENT REVERSE CURRENT IN HIGH-RESISTIVITY SILICON SURFACE-BARRIER DIODES

被引:3
作者
BERG, S [1 ]
ANDERSSON, LP [1 ]
机构
[1] UNIV UPPSALA, INST PHYS, UPPSALA, SWEDEN
来源
NUCLEAR INSTRUMENTS & METHODS | 1974年 / 114卷 / 02期
关键词
D O I
10.1016/0029-554X(74)90539-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:241 / 244
页数:4
相关论文
共 8 条
[1]  
ATALLA MM, 1966, OCT P INEA MICR C, P123
[2]   CURRENT TRANSPORT IN METAL-SEMICONDUCTOR BARRIERS [J].
CROWELL, CR ;
SZE, SM .
SOLID-STATE ELECTRONICS, 1966, 9 (11-1) :1035-&
[3]   FIELD AND THERMIONIC-FIELD EMISSION IN SCHOTTKY BARRIERS [J].
PADOVANI, FA ;
STRATTON, R .
SOLID-STATE ELECTRONICS, 1966, 9 (07) :695-&
[4]   MOBILITY OF HOLES AND ELECTRONS IN HIGH ELECTRIC FIELDS [J].
RYDER, EJ .
PHYSICAL REVIEW, 1953, 90 (05) :766-769
[5]   MEASUREMENT OF DRIFT VELOCITY OF ELECTRONS IN SILICON BY EXCITING A DIODE STRUCTURE WITH SHORT SUPERRADIANT LASER PULSES [J].
TOVE, PA ;
ANDERSSON, G ;
ERICSSON, G ;
LIDHOLT, R .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1970, ED17 (05) :407-+
[6]   DIODE CHARACTERISTICS AND EDGE EFFECTS OF METAL-SEMICONDUCTOR DIODES [J].
TOVE, PA ;
HYDER, SA ;
SUSILA, G .
SOLID-STATE ELECTRONICS, 1973, 16 (04) :513-521
[7]  
VANDERZIEL A, 1968, SOLID STATE PHYSICAL
[8]   ELECTRIC FIELD PROFILE AND ELECTRON DRIFT VELOCITIES IN LITHIUM DRIFTED SILICON [J].
ZULLIGER, HR ;
NORRIS, CB ;
SIGMON, TW ;
PEHL, RH .
NUCLEAR INSTRUMENTS & METHODS, 1969, 70 (02) :125-+