DEEP LEVEL IMPURITY EFFECTS ON FREQUENCY-DEPENDENCE OF SCHOTTKY-BARRIER CAPACITANCE

被引：39

作者：

CROWELL, CR

NAKANO, K

机构：

来源：

SOLID-STATE ELECTRONICS | 1972年 / 15卷 / 06期

关键词：

D O I：

10.1016/0038-1101(72)90002-0

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：605 / +

页数：1

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[J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (04) : 1767 - +
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REDDI, VGK
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1964, ED11 (07) : 345 - +
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SCHIBLI, E
MILNES, AG
[J]. SOLID-STATE ELECTRONICS, 1968, 11 (03) : 323 - +