THE INFLUENCE OF SAMPLE ROUGHNESS ON THE QUANTIFICATION OF MICRO-PIXE RESULTS

被引：6

作者：

ORLIC, I

VANLANGEVELDE, F

VIS, RD

机构：

[1] Department of Physics and Astronomy, Vrije Universiteit, Amsterdam

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 49卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(90)90219-K

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The intensity distribution of thick target PIXE yields emerging from several model surfaces is computed as a function of photon energy and sample composition. It is found that one thin concave dip on a perfectly homogeneous glass sample can cause changes in intensity distribution of low energy characteristic X-ray lines of 100% or more. Theoretical predictions are confirmed with experimental results. © 1990.

引用

页码：74 / 77

页数：4

共 8 条

[1] PROTON-INDUCED X-RAY-EMISSION IN TRACE ANALYSIS OF HUMAN TOOTH ENAMEL AND DENTIN [J].

AHLBERG, M ;

AKSELSSON, R .

INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES, 1976, 27 (5-6) :279-290

[2]

BOS A J J, 1986, Journal of Trace and Microprobe Techniques, V4, P57

[3] UNCERTAINTIES IN THICK-TARGET PIXE ANALYSIS [J].

CAMPBELL, JL ;

COOKSON, JA ;

PAUL, H .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 212 (1-3) :427-439

[4] EFFECTS OF RANDOM SURFACE-ROUGHNESS IN PIXE ANALYSIS OF THICK TARGETS [J].

CAMPBELL, JL ;

LAMB, RD ;

LEIGH, RG ;

NICKEL, BG ;

COOKSON, JA .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 12 (03) :402-412

[5] SPECIMEN SURFACE EFFECTS IN THICK-TARGET PIXE ANALYSIS [J].

COOKSON, JA ;

CAMPBELL, JL .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 216 (03) :489-495

[6] CALIBRATION AND LONG-TERM STABILITY OF A PIXE SET-UP [J].

JOHANSSON, GI ;

PALLON, J ;

MALMQVIST, KG ;

AKSELSSON, KR .

NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3) :81-88

[7]

MAENHAUT W, 1984, NUCL INSTRUM METH B, V1, P123

[8] TTPIXAN - A PACKAGE OF COMPUTER-PROGRAMS FOR QUANTITATIVE THICK TARGET PIXE ANALYSIS [J].

ORLIC, I ;

MAKJANIC, J ;

TROS, GHJ ;

VIS, RD .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 49 (1-4) :166-172

← 1 →