EFFECT OF THE MICROSCOPIC ELECTRONIC STATES OF THE TIP ON THE SCANNING TUNNELING MICROSCOPY IMAGE

被引：5

作者：

OHNISHI, S ^{[1
]}

TSUKADA, M ^{[1
]}

机构：

[1] UNIV TOKYO,FAC SCI,DEPT PHYS,BUNKYO KU,TOKYO 113,JAPAN

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 01期

关键词：

D O I：

10.1116/1.577058

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

[No abstract available]

引用

页码：174 / 176

页数：3

共 19 条

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