MISFIT DISLOCATION CHARACTERISTICS IN QUATERNARY HETEROJUNCTIONS GA1-XALXAS1-YPY-GAAS ANALYZED BY SYNCHROTRON RADIATION WHITE BEAM TOPOGRAPHY

被引：50

作者：

PETROFF, JF ^{[1
]}

SAUVAGE, M ^{[1
]}

机构：

[1] UNIV PARIS 11, LURE, F-91405 ORSAY, FRANCE

来源：

JOURNAL OF CRYSTAL GROWTH | 1978年 / 43卷 / 05期

关键词：

D O I：

10.1016/0022-0248(78)90052-0

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：628 / 636

页数：9

共 16 条

[1] LIKE-SIGN ASYMMETRIC DISLOCATIONS IN ZINC-BLENDE STRUCTURE [J].

ABRAHAMS, MS ;

BLANC, J ;

BUIOCCHI, CJ .

APPLIED PHYSICS LETTERS, 1972, 21 (05) :185-&

[2] ASYMMETRY OF MISFIT DISLOCATIONS IN HETEROEPITAXIAL LAYERS ON (001) GAAS SUBSTRATES [J].

BARTELS, WJ ;

NIJMAN, W .

JOURNAL OF CRYSTAL GROWTH, 1977, 37 (03) :204-214

[3]

DRUZHININA LV, 1975, SOV PHYS-TECH PHYS, V7, P935

[4] DOUBLE-CRYSTAL SPECTROMETER MEASUREMENTS OF LATTICE-PARAMETERS AND X-RAY TOPOGRAPHY ON HETEROJUNCTIONS GAAS-ALXGA1-XAS [J].

ESTOP, E ;

IZRAEL, A ;

SAUVAGE, M .

ACTA CRYSTALLOGRAPHICA SECTION A, 1976, 32 (JUL1) :627-&

[5] MEASUREMENTS OF INTEGRATED INTENSITY NEAR ABSORPTION-EDGE WITH SYNCHROTON RADIATION [J].

FUKAMACHI, T ;

HOSOYA, S ;

KAWAMURA, T ;

HASTINGS, J .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (AUG1) :321-324

[6] SYNCHROTRON RADIATION - APPLICATION TO HIGH-SPEED, HIGH-RESOLUTION X-RAY-DIFFRACTION TOPOGRAPHY [J].

HART, M .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (AUG1) :436-444

[7]

Hirth J.P., 1982, THEORY DISLOCATIONS

[8] DISLOCATIONS IN THE DIAMOND LATTICE [J].

HORNSTRA, J .

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1958, 5 (1-2) :129-141

[9] X-RAY STUDY OF ALXGA1-XAS EPITAXIAL LAYERS [J].

ISHIDA, K ;

MATSUI, J ;

KAMEJIMA, T ;

SAKUMA, I .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (01) :255-262

[10] ACCOMMODATION OF MISFIT ACROSS INTERFACE TEBWEEN CRYSTALS OF SEMICONDUCTING ELEMENTS OR COMPOUNDS [J].

MATTHEWS, JW ;

MADER, S ;

LIGHT, TB .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (09) :3800-&

← 1 2 →