COMPARISON OF ELECTRICAL AND ATOMIC PROFILES OF MG-24 AND ZN-64 IMPLANTED GAAS SAMPLES AND GAAS-GAALAS HETEROSTRUCTURES FOR BIPOLAR-TRANSISTOR APPLICATIONS

被引:9
作者
DUHAMEL, N [1 ]
DAOUDKETATA, K [1 ]
DESCOUTS, B [1 ]
KRAUZ, P [1 ]
GAUNEAU, M [1 ]
GODEFROY, S [1 ]
机构
[1] CTR NATL ETUD TELECOMMUN, F-22301 LANNION, FRANCE
关键词
D O I
10.1007/BF02661888
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:377 / 382
页数:6
相关论文
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