ELECTRON-MICROSCOPY STUDY OF DEFECT STRUCTURES IN RECRYSTALLIZED AMORPHOUS LAYERS OF SELF-ION-IRRADIATED (111) SILICON

被引：33

作者：

RECHTIN, MD ^{[1
]}

PRONKO, PP ^{[1
]}

FOTI, G ^{[1
]}

CSEPREGI, L ^{[1
]}

KENNEDY, EF ^{[1
]}

MAYER, JW ^{[1
]}

机构：

[1] CALTECH,PASADENA,CA 91125

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1978年 / 37卷 / 05期

关键词：

D O I：

10.1080/01418617808239194

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：605 / 620

页数：16

共 12 条

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[10] ELECTRON MICROSCOPY AND DIFFRACTION OF TWINNED STRUCTURES IN EVAPORATED FILMS OF GOLD [J].

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