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DEVICE FABRICATION BY SCANNED PROBE OXIDATION
被引:137
作者
:
DAGATA, JA
论文数:
0
引用数:
0
h-index:
0
机构:
NATL INST STAND & TECHNOL, DIV PRECIS ENGN, GAITHERSBURG, MD 20899 USA
NATL INST STAND & TECHNOL, DIV PRECIS ENGN, GAITHERSBURG, MD 20899 USA
DAGATA, JA
[
1
]
机构
:
[1]
NATL INST STAND & TECHNOL, DIV PRECIS ENGN, GAITHERSBURG, MD 20899 USA
来源
:
SCIENCE
|
1995年
/ 270卷
/ 5242期
关键词
:
D O I
:
10.1126/science.270.5242.1625
中图分类号
:
O [数理科学和化学];
P [天文学、地球科学];
Q [生物科学];
N [自然科学总论];
学科分类号
:
07 ;
0710 ;
09 ;
摘要
:
[No abstract available]
引用
收藏
页码:1625 / 1626
页数:2
相关论文
共 25 条
[21]
ATOMIC AND MOLECULAR MANIPULATION WITH THE SCANNING TUNNELING MICROSCOPE
[J].
STROSCIO, JA
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0
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IBM CORP, ALMADEN RES CTR, DIV RES, SAN JOSE, CA 95120 USA
IBM CORP, ALMADEN RES CTR, DIV RES, SAN JOSE, CA 95120 USA
STROSCIO, JA
;
EIGLER, DM
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IBM CORP, ALMADEN RES CTR, DIV RES, SAN JOSE, CA 95120 USA
IBM CORP, ALMADEN RES CTR, DIV RES, SAN JOSE, CA 95120 USA
EIGLER, DM
.
SCIENCE,
1991,
254
(5036)
:1319
-1326
[22]
TIP-INDUCED ANODIZATION OF TITANIUM SURFACES BY SCANNING-TUNNELING-MICROSCOPY - A HUMIDITY EFFECT ON NANOLITHOGRAPHY
[J].
SUGIMURA, H
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0
引用数:
0
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0
机构:
OSAKA UNIV,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN
SUGIMURA, H
;
UCHIDA, T
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0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN
UCHIDA, T
;
KITAMURA, N
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OSAKA UNIV,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN
KITAMURA, N
;
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0
h-index:
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OSAKA UNIV,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN
MASUHARA, H
.
APPLIED PHYSICS LETTERS,
1993,
63
(09)
:1288
-1290
[23]
NANOMETER-SCALE MODIFICATION OF THE TRIBOLOGICAL PROPERTIES OF SI(100) BY SCANNING FORCE MICROSCOPE
[J].
TEUSCHLER, T
论文数:
0
引用数:
0
h-index:
0
机构:
Institut für Technische Physik, Universität ErlangenâNürnberg, D-91058, Erlangen
TEUSCHLER, T
;
MAHR, K
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0
引用数:
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机构:
Institut für Technische Physik, Universität ErlangenâNürnberg, D-91058, Erlangen
MAHR, K
;
MIYAZAKI, S
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0
引用数:
0
h-index:
0
机构:
Institut für Technische Physik, Universität ErlangenâNürnberg, D-91058, Erlangen
MIYAZAKI, S
;
HUNDHAUSEN, M
论文数:
0
引用数:
0
h-index:
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Institut für Technische Physik, Universität ErlangenâNürnberg, D-91058, Erlangen
HUNDHAUSEN, M
;
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LEY, L
.
APPLIED PHYSICS LETTERS,
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[24]
TEUSCHLER T, IN PRES APPL PHYS LE
[25]
NANOMETER-STRUCTURE WRITING ON SI(100) SURFACES USING A NON-CONTACT-MODE ATOMIC-FORCE MICROSCOPE
[J].
WANG, DW
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0
引用数:
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Device Research Laboratory, Department of Electrical Engineering, University of California at Los Angeles, Los Angeles
WANG, DW
;
TSAU, LM
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0
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Device Research Laboratory, Department of Electrical Engineering, University of California at Los Angeles, Los Angeles
TSAU, LM
;
WANG, KL
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Device Research Laboratory, Department of Electrical Engineering, University of California at Los Angeles, Los Angeles
WANG, KL
.
APPLIED PHYSICS LETTERS,
1994,
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(11)
:1415
-1417
←
1
2
3
→
共 25 条
[21]
ATOMIC AND MOLECULAR MANIPULATION WITH THE SCANNING TUNNELING MICROSCOPE
[J].
STROSCIO, JA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, ALMADEN RES CTR, DIV RES, SAN JOSE, CA 95120 USA
IBM CORP, ALMADEN RES CTR, DIV RES, SAN JOSE, CA 95120 USA
STROSCIO, JA
;
EIGLER, DM
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, ALMADEN RES CTR, DIV RES, SAN JOSE, CA 95120 USA
IBM CORP, ALMADEN RES CTR, DIV RES, SAN JOSE, CA 95120 USA
EIGLER, DM
.
SCIENCE,
1991,
254
(5036)
:1319
-1326
[22]
TIP-INDUCED ANODIZATION OF TITANIUM SURFACES BY SCANNING-TUNNELING-MICROSCOPY - A HUMIDITY EFFECT ON NANOLITHOGRAPHY
[J].
SUGIMURA, H
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN
SUGIMURA, H
;
UCHIDA, T
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN
UCHIDA, T
;
KITAMURA, N
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN
KITAMURA, N
;
MASUHARA, H
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN
MASUHARA, H
.
APPLIED PHYSICS LETTERS,
1993,
63
(09)
:1288
-1290
[23]
NANOMETER-SCALE MODIFICATION OF THE TRIBOLOGICAL PROPERTIES OF SI(100) BY SCANNING FORCE MICROSCOPE
[J].
TEUSCHLER, T
论文数:
0
引用数:
0
h-index:
0
机构:
Institut für Technische Physik, Universität ErlangenâNürnberg, D-91058, Erlangen
TEUSCHLER, T
;
MAHR, K
论文数:
0
引用数:
0
h-index:
0
机构:
Institut für Technische Physik, Universität ErlangenâNürnberg, D-91058, Erlangen
MAHR, K
;
MIYAZAKI, S
论文数:
0
引用数:
0
h-index:
0
机构:
Institut für Technische Physik, Universität ErlangenâNürnberg, D-91058, Erlangen
MIYAZAKI, S
;
HUNDHAUSEN, M
论文数:
0
引用数:
0
h-index:
0
机构:
Institut für Technische Physik, Universität ErlangenâNürnberg, D-91058, Erlangen
HUNDHAUSEN, M
;
LEY, L
论文数:
0
引用数:
0
h-index:
0
机构:
Institut für Technische Physik, Universität ErlangenâNürnberg, D-91058, Erlangen
LEY, L
.
APPLIED PHYSICS LETTERS,
1995,
66
(19)
:2499
-2501
[24]
TEUSCHLER T, IN PRES APPL PHYS LE
[25]
NANOMETER-STRUCTURE WRITING ON SI(100) SURFACES USING A NON-CONTACT-MODE ATOMIC-FORCE MICROSCOPE
[J].
WANG, DW
论文数:
0
引用数:
0
h-index:
0
机构:
Device Research Laboratory, Department of Electrical Engineering, University of California at Los Angeles, Los Angeles
WANG, DW
;
TSAU, LM
论文数:
0
引用数:
0
h-index:
0
机构:
Device Research Laboratory, Department of Electrical Engineering, University of California at Los Angeles, Los Angeles
TSAU, LM
;
WANG, KL
论文数:
0
引用数:
0
h-index:
0
机构:
Device Research Laboratory, Department of Electrical Engineering, University of California at Los Angeles, Los Angeles
WANG, KL
.
APPLIED PHYSICS LETTERS,
1994,
65
(11)
:1415
-1417
←
1
2
3
→